Reliability of Nanoscale Circuits and Systems

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Publication Year: 2011
Imprint: Springer New York
Format: P
Weight (Gram): 349