Spectroscopic Ellipsometry for Photovoltaics

Spectroscopic Ellipsometry for Photovoltaics

Hiroyuki Fujiwara

Format: Print Book

ISBN: 9783319753751

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This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Publication Year: 2018
Imprint: Springer International Publishing
Format: H
Weight (Gram): 1081

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