Applied Crystallography - Proceedings Of The Xvii International Conference
Format: Print Book
ISBN: 9789810232832
Tax included.
This proceedings volume contains research data on structural investigation of materials of high industrial value. In particular, the following issues are discussed: phase characterization by diffraction methods, application of direct methods for solving crystal structure from powder diffraction, electron crystallography, Rietveld method application, defects and substructure analysis in materials, new X-ray methods, small angle scattering studies of crystalline and amorphous solids, phase transformation studies including crystallography of the reversible martensitic transformation, structure of noncrystalline materials, structure and properties of new materials.
Format: Hardcover
No of Pages: 512
Imprint: World Scientific
Publication date: 19980806